FLYING PROBE TESTER FA1283

FLYING PROBE TESTER
FA1283

Complete Electrical Testing of High-Function Boards with
a Single Unit

Hioki PCB and substrate inspection equipment leverages our core competency in high precision component testing. The FA1283 is a horizontal-loading, double-sided flying probe tester with a minimum 15 μm × 15 μm probing precision and rapid 100 times/second test speed.

Key Features
• Achieves square 15 μm high precision contacts and high speed probing
• Max.100 points/s ultra-high speed inspection
• Inspection is possible from general bare board to fine and high density substrates such as flexible substrate and CSP.
• In addition to capacitance measurement, measurement functions for component built-in boards such as diodes are also complete

Model No. (Order Code)

FA1283-01 board-carrier N/A
FA1283-11 with board-carrier
Complete Electrical Testing of High-Function Boards with a Single Unit

The FA1283 is a next-generation bare board testing system that incorporates component measurement expertise accumulated by Hioki in the course of developing populated board testing products.

Down to the 1μm

A High-Accuracy FLYING PROBE TESTER Aiming at φ10 μm Contact Total Probing Accuracy □ 15 μm (when FA1971-01 is installed)

Not One Second Wasted

A smooth start to initial testing is vital.
Electrical testing schedules are short and strict.
・Tension Clamp Equipped as Standard
・Laser board thickness correction unit that measures board flex and undulation
・Capacitance measurement vacuum stage for testing boards that cannot be clamped (optional)
・Available in both offline and automatic transport variants.
・FEB-LINE Data Creation System UA1781 provides accurate data, even for complex designs.

Total Measurement Mastery

A single unit for everything from simple continuity and insulation testing to advanced function measurements for component testing.
A testing unit and measurement unit for selection and analysis.
This high-potential flying probe tester is designed to fit your needs.

Vacuum Unit for Capacitance Test E4001

"Nothing ships without electrical testing."
Vacuum absorption stage E4001 is used to perform capacitance method O/S testing, which is unaffected by board shape.
Perform stable testing independent of board dimensions or thickness.

Improving the quality of insulation testing

The tester's insulation test capabilities have a direct impact on product quality when it comes to phenomena such as burning up micro-shorts and arcing during testing.
The FA1283 can perform super-high-speed insulation testing at 100 GΩ/10 msec.
It also provides a variety of functions designed to guarantee a high level of insulation quality, including micro-short detection, arc detection, bipolar testing, and impulse testing.

Mastering continuity testing and resistance measurement

Users can select from multiple modes, including 4-terminal low-resistance measurement, 200 mA continuity measurement, and capacitance measurement O/S testing.
Use 4-terminal measurement to detect increases in wiring resistance caused by phenomena such as open vias, and use continuity testing at large currents of up to 200 mA to guarantee board integrity under conditions that approach actual operation.
The FA1283 provides numerous measurement modes that are made possible by Hioki's unique measurement expertise, from low-voltage resistance measurement at 0.1 V to high-voltage resistance measurement for materials such as ITO that have high insulation resistivity.

Embedded Device Measurement: A Sharp Departure from LCR Measurement

The FA1283 is a next-generation bare board testing system that incorporates component measurement expertise accumulated by Hioki in the course of developing populated board testing products.
Its measurement capabilities range from basic measurement functions such as MLCC measurement to guard functionality for measuring composite circuits, phase separation measurement, and other capabilities that go beyond the typical features of in-circuit testers,It also delivers dedicated modes such as current consumption testing and leakage current testing for use in LSI reliability testing.

These functions are ideal for testing populated boards and differ from those offered by LCR meters.

Half of Data Generation Time With New Platform FEB-LINE UA1781

Flying probe test for Embedded and Bare boards UA1781
3-in-1 Editing Software for Bare Boards Testing
Edit data and Generate test point and Built-in component support

・3-in-1 for editing, test-point generation, and built-in component support
・New Windows-optimized algorithm
・Free from data volume restrictions for increased freedom
・Added new commands to reduce data generation time by half

Flying probe test for Embedded and Bare boards UA1781