Automatic Test Equipment

Products

The Power to Connect

A T E Concept The Power to Connect

Continuing to create new solutions together

Continuing to create new solutions together

Bare Board Testing (flying probe tester)

	FLYING PROBE TESTER FA1816 High-speed pattern testing using the capacitive measurement method • Reduce probe marks in combination with the latest probes • Significantly improved operability
	FLYING PROBE TESTER FA1817 Vertical type 4 arm double-sided inspection Open via defect detection with low resistance measurement • Vertical double-sided bare board inspection machine • Open via defect detection with low resistance measurement • Detect pattern shape abnormality and voids with super insulation resistance testing
	FLYING PROBE TESTER FA1811 High precision contact in a space of square 10 μm. • Achieve both high precision contact and high-speed probing. • Double test method delivers an operation rate of 100%.
	FLYING PROBE TESTER FA1283 Max.100 points/s ultra-high speed inspection High-precision probing 15μm • Max.100 points/s ultra-high speed inspection • High-precision probing 15μm
	FEB-LINE INSPECTION DATA CREATION SYSTEM UA1781 1/2 Data Generation Time With New Platform • 3-in-1 for editing, test-point generation, and built-in component support • New Windows-optimized algorithm • Free from data volume restrictions for increased freedom • Added new commands to reduce data generation time by half
	FAIL VISUALIZER UA1782 Dedicated visualization software for Hioki testing system • Dedicated visualization software for Hioki electrical testing equipment and data creation systems

Populated Board Testing

	IN-CIRCUIT TESTER FA1220-02 • Extensive functionality for improving productivity • Slide-in mechanism that’s operator-friendly • Max. 2048 pins • Touch Panel PC • Data creation support functionality
	IN-CIRCUIT TESTER FA1220-11 •Extensive functionality for building efficient production lines •Installation area about 23% smaller than the previous model • Detection of IC reverse insertion and electrolytic capacitors that have been mounted backwards. • 4-wire resistance testing • Data creation support functionality
	IN-CIRCUIT TESTER FA1220 • High-speed, multichannel testing of populated boards • Extensive function testing • Macro-testing function to increase test efficiency • 4-wire resistance testing
	SHORT-OPEN TESTER FA1221 • Multichannel short/open 4-wire test equipment for inspecting populated boards • Specifically designed for short/open testing • 4-wire resistance testing
	FLYING PROBE TESTER FA1240-6x 4-terminal testing high-speed • Quickly complete programs that take into account component height • Automatic calculation of arm interference

	IN-CIRCUIT HiTESTER 1220 High Performance Populated Board Testing with Expansion Capabilities • 4-terminal testing • High-current/high-voltage diode testing • High-speed testing of multi-board layouts

Application Software

	DATA ANALYSIS SOFTWARE UA1801 • Detect latent defects with AI • Data analysis utilizing high-precision measurement technology • Detect significant points that can cause latent board defects • Compatible with the FA1816, FA1817, FA1811, FA1812, etc.
	FEB-LINE INSPECTION DATA CREATION SYSTEM UA1781 1/2 Data Generation Time With New Platform • 3-in-1 for editing, test-point generation, and built-in component support • New Windows-optimized algorithm • Free from data volume restrictions for increased freedom • Added new commands to reduce data generation time by half
	FAIL VISUALIZER UA1782 Dedicated visualization software for Hioki testing system • Dedicated visualization software for Hioki electrical testing equipment and data creation systems
	FIT-LINE INSPECTION DATA CREATION SYSTEM UA1780 Generate high-quality board testing data without physical boards • Generate high-quality board testing data without physical boards

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