The Power to Connect

| A T E Concept The Power to ConnectContinuing to create new solutions together
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Bare Board Testing (flying probe tester)

| FLYING PROBE TESTER FA1816High-speed pattern testing using the capacitive measurement method
 • Reduce probe marks in combination with the latest probes • Significantly improved operability |

| FLYING PROBE TESTER FA1817Vertical type 4 arm double-sided inspection
Open via defect detection with low resistance measurement
 • Vertical double-sided bare board inspection machine • Open via defect detection with low resistance measurement • Detect pattern shape abnormality and voids with super insulation resistance testing |

| FLYING PROBE TESTER FA1811High precision contact
in a space of square 10 μm.
 • Achieve both high precision contact and high-speed probing. • Double test method delivers an operation rate of 100%. |

| FLYING PROBE TESTER FA1283Max.100 points/s ultra-high speed inspection
High-precision probing 15μm
 • Max.100 points/s ultra-high speed inspection • High-precision probing 15μm |

| FEB-LINE INSPECTION DATA CREATION SYSTEM UA17811/2 Data Generation Time
With New Platform
 • 3-in-1 for editing, test-point generation, and built-in component support • New Windows-optimized algorithm • Free from data volume restrictions for increased freedom • Added new commands to reduce data generation time by half |

| FAIL VISUALIZER UA1782Dedicated visualization software
for Hioki testing system
 • Dedicated visualization software for Hioki electrical testing equipment and data creation systems |
Populated Board Testing

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IN-CIRCUIT TESTER FA1220-02• Extensive functionality for improving productivity
• Slide-in mechanism that’s operator-friendly
 • Max. 2048 pins • Touch Panel PC • Data creation support functionality |

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IN-CIRCUIT TESTER FA1220-11
•Extensive functionality for building efficient production lines
•Installation area about 23% smaller than the previous model
 • Detection of IC reverse insertion and electrolytic capacitors that have been mounted backwards. • 4-wire resistance testing • Data creation support functionality |

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IN-CIRCUIT TESTER FA1220
• High-speed, multichannel testing of populated boards
 • Extensive function testing • Macro-testing function to increase test efficiency • 4-wire resistance testing |

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SHORT-OPEN TESTER FA1221
• Multichannel short/open 4-wire test equipment for inspecting populated boards
 • Specifically designed for short/open testing • 4-wire resistance testing |

| FLYING PROBE TESTER FA1240-6x4-terminal testing
high-speed
 • Quickly complete programs that take into account component height • Automatic calculation of arm interference |
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| IN-CIRCUIT HiTESTER 1220High Performance Populated Board Testing with Expansion Capabilities
 • 4-terminal testing • High-current/high-voltage diode testing • High-speed testing of multi-board layouts |
Application Software

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DATA ANALYSIS SOFTWARE UA1801
• Detect latent defects with AI
• Data analysis utilizing high-precision measurement technology
 • Detect significant points that can cause latent board defects • Compatible with the FA1816, FA1817, FA1811, FA1812, etc. |

| FEB-LINE INSPECTION DATA CREATION SYSTEM UA17811/2 Data Generation Time
With New Platform
 • 3-in-1 for editing, test-point generation, and built-in component support • New Windows-optimized algorithm • Free from data volume restrictions for increased freedom • Added new commands to reduce data generation time by half |

| FAIL VISUALIZER UA1782Dedicated visualization software
for Hioki testing system
 • Dedicated visualization software for Hioki electrical testing equipment and data creation systems |

| FIT-LINE INSPECTION DATA CREATION SYSTEM UA1780Generate high-quality board testing data
without physical boards
 • Generate high-quality board testing data without physical boards |