Product Category
- Automatic Test Equipment
- Clamp Meters
- Current Probes | Current Sensors
- Data Acquisition / Oscilloscopes / Memory Recorders
- Digital Multimeters
- Electrical Safety Testers | Hipot, Insulation, Leakage Testers
- Ground Testers Voltage Detectors Phase Detectors
- Insulation Testers
- LCR Meters / Impedance Analyzers
- Magnetic Field | Sound Level | Lux | Rotation
- Multichannel Data Loggers
- Power Meters / Power Analyzers
- Power Quality Analyzers / Power Loggers
- Resistance Meters / Battery Testers
- Super Megohmmeters | Electrometers | Picoammeters
- Temperature Data Loggers / Compact Loggers
Products
The Power to Connect
A T E Concept The Power to Connect |
Bare Board Testing (flying probe tester)
![]() FLYING PROBE TESTER FA1817• Vertical double-sided bare board inspection machine • Open via defect detection with low resistance measurement • Detect pattern shape abnormality and voids with super insulation resistance testing | |
FLYING PROBE TESTER FA1811• Achieve both high precision contact and high-speed probing. • Double test method delivers an operation rate of 100%. | |
FLYING PROBE TESTER FA1283• Max.100 points/s ultra-high speed inspection • High-precision probing 15μm | |
FEB-LINE INSPECTION DATA CREATION SYSTEM UA1781• 3-in-1 for editing, test-point generation, and built-in component support • New Windows-optimized algorithm • Free from data volume restrictions for increased freedom • Added new commands to reduce data generation time by half | |
FLYING PROBE TESTER FA1116• Reduced-impact link probes CP1072-01(option) • Laser height-adjustment Unit FA1950-06(option) • Reduced fine pattern test times • High-speed pattern testing using capacitance measurement | |
FAIL VISUALIZER UA1782• Dedicated visualization software for Hioki electrical testing equipment and data creation systems |
Bare Board Testing with test fixture
Populated Board Testing
• Max. 2048 pins • Touch Panel PC • Data creation support functionality | |
FLYING PROBE TESTER FA1240-6x• Quickly complete programs that take into account component height • Automatic calculation of arm interference | |
IN-CIRCUIT HiTESTER 1220• 4-terminal testing • High-current/high-voltage diode testing • High-speed testing of multi-board layouts |
Application Software
FEB-LINE INSPECTION DATA CREATION SYSTEM UA1781• 3-in-1 for editing, test-point generation, and built-in component support • New Windows-optimized algorithm • Free from data volume restrictions for increased freedom • Added new commands to reduce data generation time by half | |
FAIL VISUALIZER UA1782• Dedicated visualization software for Hioki electrical testing equipment and data creation systems | |
FIT-LINE INSPECTION DATA CREATION SYSTEM UA1780• Generate high-quality board testing data without physical boards |