Automatic Test Equipment

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A T E Concept The Power to Connect

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Bare Board Testing (flying probe tester)

	FLYING PROBE TESTER FA1811 High precision contact in a space of square 10 μm. • Achieve both high precision contact and high-speed probing. • Double test method delivers an operation rate of 100%.
	FLYING PROBE TESTER FA1283 Max.100 points/s ultra-high speed inspection High-precision probing 15μm • Max.100 points/s ultra-high speed inspection • High-precision probing 15μm
	FEB-LINE INSPECTION DATA CREATION SYSTEM UA1781 1/2 Data Generation Time With New Platform • 3-in-1 for editing, test-point generation, and built-in component support • New Windows-optimized algorithm • Free from data volume restrictions for increased freedom • Added new commands to reduce data generation time by half
	FLYING PROBE TESTER FA1116 High-speed Testing at Up to 100 Points/sec. with Half the Impact Mark Depth • Reduced-impact link probes CP1072-01(option) • Laser height-adjustment Unit FA1950-06(option) • Reduced fine pattern test times • High-speed pattern testing using capacitance measurement
	FAIL VISUALIZER UA1782 Dedicated visualization software for Hioki testing system • Dedicated visualization software for Hioki electrical testing equipment and data creation systems
	X-Y BOARD HiTESTER 1270, 1271 Double-sided, 4 arms testing Low-resistance measurement (option) • Double-sided, 4 arms testing • Low-resistance measurement function (option)

Bare Board Testing with test fixture

	BARE BOARD TESTER 1232 High-Precision Batch Fixture-Type Testing System that Support Boards with Embedded Passive and Active Devices • Double-sided alignment • 340 × 330 mm working area
	BARE BOARD HiTESTER 1230 All-In-One Solution for Testing the Reliability of Connections on Printed Circuit Boards •Emdedded passives/actives test •HDI via resistance •Known-good reference values for wiring pattern resistance

Populated Board Testing

	FLYING PROBE TESTER FA1240-6x 4-terminal testing high-speed • Quickly complete programs that take into account component height • Automatic calculation of arm interference

	IN-CIRCUIT HiTESTER 1220 High Performance Populated Board Testing with Expansion Capabilities • 4-terminal testing • High-current/high-voltage diode testing • High-speed testing of multi-board layouts

Application Software

	FEB-LINE INSPECTION DATA CREATION SYSTEM UA1781 1/2 Data Generation Time With New Platform • 3-in-1 for editing, test-point generation, and built-in component support • New Windows-optimized algorithm • Free from data volume restrictions for increased freedom • Added new commands to reduce data generation time by half
	FAIL VISUALIZER UA1782 Dedicated visualization software for Hioki testing system • Dedicated visualization software for Hioki electrical testing equipment and data creation systems
	FIT-LINE INSPECTION DATA CREATION SYSTEM UA1780 Generate high-quality board testing data without physical boards • Generate high-quality board testing data without physical boards

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