The Power to Connect
| A T E Concept The Power to ConnectContinuing to create new solutions together  |
Bare Board Testing (flying probe tester)
|  FLYING PROBE TESTER FA1817Vertical type 4 arm double-sided inspection Open via defect detection with low resistance measurement • Vertical double-sided bare board inspection machine • Open via defect detection with low resistance measurement • Detect pattern shape abnormality and voids with super insulation resistance testing |
| FLYING PROBE TESTER FA1811High precision contact in a space of square 10 μm. • Achieve both high precision contact and high-speed probing. • Double test method delivers an operation rate of 100%. |
| FLYING PROBE TESTER FA1283Max.100 points/s ultra-high speed inspection High-precision probing 15μm • Max.100 points/s ultra-high speed inspection • High-precision probing 15μm |
| FEB-LINE INSPECTION DATA CREATION SYSTEM UA17811/2 Data Generation Time With New Platform • 3-in-1 for editing, test-point generation, and built-in component support • New Windows-optimized algorithm • Free from data volume restrictions for increased freedom • Added new commands to reduce data generation time by half |
| FLYING PROBE TESTER FA1116High-speed Testing at Up to 100 Points/sec. with Half the Impact Mark Depth • Reduced-impact link probes CP1072-01(option) • Laser height-adjustment Unit FA1950-06(option) • Reduced fine pattern test times • High-speed pattern testing using capacitance measurement |
| FAIL VISUALIZER UA1782Dedicated visualization software for Hioki testing system • Dedicated visualization software for Hioki electrical testing equipment and data creation systems |
Bare Board Testing with test fixture
| BARE BOARD TESTER 1232High-Precision Batch Fixture-Type Testing System that Support Boards with Embedded Passive and Active Devices • Double-sided alignment • 340 × 330 mm working area |
| BARE BOARD HiTESTER 1230All-In-One Solution for Testing the Reliability of Connections on Printed Circuit Boards •Emdedded passives/actives test •HDI via resistance •Known-good reference values for wiring pattern resistance |
Populated Board Testing
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| FLYING PROBE TESTER FA1240-6x4-terminal testing high-speed • Quickly complete programs that take into account component height • Automatic calculation of arm interference |
| IN-CIRCUIT HiTESTER 1220High Performance Populated Board Testing with Expansion Capabilities • 4-terminal testing • High-current/high-voltage diode testing • High-speed testing of multi-board layouts |
Application Software
| FEB-LINE INSPECTION DATA CREATION SYSTEM UA17811/2 Data Generation Time With New Platform • 3-in-1 for editing, test-point generation, and built-in component support • New Windows-optimized algorithm • Free from data volume restrictions for increased freedom • Added new commands to reduce data generation time by half |
| FAIL VISUALIZER UA1782Dedicated visualization software for Hioki testing system • Dedicated visualization software for Hioki electrical testing equipment and data creation systems |
| FIT-LINE INSPECTION DATA CREATION SYSTEM UA1780Generate high-quality board testing data without physical boards • Generate high-quality board testing data without physical boards |
