2 May 2019 : Application Note – HIOKI PQ3198

Measure Lightning-induced Voltage Dips in a Low-Voltage Circuit
You can measure the effects of a voltage dip caused by lightning on the low-voltage circuit of a highvoltage
system using the PQ3198 Power Quality Analyzer.

■Highlights
• There is no way to avoid a voltage dip caused by lightning hitting a high-voltage system. This also causes a
voltage dip in the low-voltage circuit so utility users need to take measures.
• A dip event function of the PQ3198 Power Quality Analyzer is useful in detecting a voltage dip. The dip event
function detects a voltage dip when the voltage RMS value falls below the threshold.
• When a dip event occurs, it records the changes in the RMS value during a period of 0.5 s before the event and
during a period of 29.5 s after the event and the instantaneous waveforms during a period of 200 ms when the event occurs.


■The difference between PQ3198 and PQ3100
• PQ3198 records instantaneous waveforms of 200ms when occurring the voltage drop event and max. 1 sec
after the event.
• PQ3100 records instantaneous waveforms of max. 1 sec before the voltage drop event, 200ms when occurring
the voltage drop event, and max. 10 secs after the event.


Products Used
• Power Quality Analyzer PQ3198
• Power Quality Analyzer PQ3198-92 (kit including 600A sensor*4 and an application software)
• Power Quality Analyzer PQ3198-94 (kit including 6000A sensor*4 and an application software)
• Power Quality Analyzer PQ3100
• Power Quality Analyzer PQ3100-91 (kit including 600A sensor*2 and an application software)
• Power Quality Analyzer PQ3100-92 (kit including 600A sensor*4 and an application software)
• Power Quality Analyzer PQ3100-94 (kit including 6000A sensor*4 and an application software)

More Information
PQ3198 Power Quality Analyzer